Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits by Sachdev, Manoj
Kalaignar Centenary Library, Madurai · 1 of 2 copies available to borrow
Where to find it: Third floor, call number 621.3815 SAC.
Book details
- Author
- Sachdev, Manoj
- Publisher
- Springer
- Year
- 2010
- ISBN
- 9788184894295
Copies in the library (2)
| Floor | Call number | Barcode | Status |
|---|---|---|---|
| Third floor | 621.3815 SAC | 292054 | Available to borrow |
| Sixth floor | 621.3815 SAC | 292053 | Reference only (read in the library) |
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