Scanning Probe Microscopy, Atomic Force Microscopy And Scanning Tunneling Microscopy by Voigtländer, Bert
Kalaignar Centenary Library, Madurai · reference copy, to be read in the library
Where to find it: Third floor, call number 502.82 VOI.
Book details
- Author
- Voigtländer, Bert
- Publisher
- Springer
- Year
- 2015
- Pages
- 382
- ISBN
- 9783662505571
Copies in the library (1)
| Floor | Call number | Barcode | Status |
|---|---|---|---|
| Third floor | 502.82 VOI | 315210 | Reference only (read in the library) |
Next to this on the shelf
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- Dictionary Of Microscopy 502.82 HEA
- Atomic Force Microscopy Fundamental Concepts And Laboratory Investigations 502.82 SAN
- Scanning Probe Microscopy 502.82 TOM
- Scanning Probe Microscopy, Atomic Force Microscopy And Scanning Tunneling Microscopy (this book)
- Physical Principles Of Electron Microscopy: an Introduction To Tem, Sem, And Aem 502.825 EGE
- Scanning Electron Microscopy And X Ray Microanalysis 502.825 GOL
- Electron Microscopy and Analysis 502.825 GOO
- Electron Microscopy And Analysis 502.825 GOO