Physical Principles Of Electron Microscopy: an Introduction To Tem, Sem, And Aem by Egerton, Ray.F
Kalaignar Centenary Library, Madurai · reference copy, to be read in the library
Where to find it: Third floor, call number 502.825 EGE.
Book details
- Author
- Egerton, Ray.F
- Publisher
- Springer
- Year
- 2005
- Pages
- 202
- ISBN
- 9780387258003
Copies in the library (1)
| Floor | Call number | Barcode | Status |
|---|---|---|---|
| Third floor | 502.825 EGE | 328666 | Reference only (read in the library) |
Next to this on the shelf
- Dictionary Of Microscopy 502.82 HEA
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- Physical Principles Of Electron Microscopy: an Introduction To Tem, Sem, And Aem (this book)
- Scanning Electron Microscopy And X Ray Microanalysis 502.825 GOL
- Electron Microscopy and Analysis 502.825 GOO
- Electron Microscopy And Analysis 502.825 GOO
- Electron Microscopy and Analysis 2003 : Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3–5 September 2003 502.825 MCV